Recent News

  • 5/7/13
    Nanotronics Imaging will be demonstrating the  nSPEC® and all the exciting upgrades to the system and software at the CS ManTech Conference in New Orleans next week (Monday May 13th through Wednesday May 15h). Please join us at booth 217 where you can meet CEO Matthew Putman, members of...
  • 4/10/13
    Nanotronics Imaging software now comes with multiple analysis reporting.  What this means is that users can now compare and contrast different types of defects on the same material in a single report.  This saves time and can provide multiple levels of rich data about your sample....
  • 4/3/13
    Nanotronics Imaging recently began offering the  nSPEC® with an Atomic Force Microscope (AFM) that is so small, it fits right into the nose piece of the  nSPEC®.  But small does not mean insignificant by any means. With the AFM tip, users can now quickly and efficiently probe...