Nanotronics Imaging has developed an automated inspection microscope which incorporates a convergence of modern optics, motion control and image capture, combined with unique measurements in order to provide the first "Point and Shoot" microscopes for use in industrial and medical applications. With a focus on crisp, high resolution, rapid, easy to use analysis, and customer configuration, nSPEC®, nPATH™ and other Nanotronics Imaging products are designed to make object recognition, defect detection and other features of interest repeatable and quantifiable
Nanotronics Imaging will be demonstrating the nSPEC® and all the exciting upgrades to the system and software at the CS ManTech Conference in New Orleans next week (Monday May 13th through Wednesday May 15h). Please join us at booth 217 where you can meet CEO Matthew Putman, members of...
Nanotronics Imaging recently began offering the nSPEC® with an Atomic Force Microscope (AFM) that is so small, it fits right into the nose piece of the nSPEC®. But small does not mean insignificant by any means. With the AFM tip, users can now quickly and efficiently probe...